Dynamic In-situ Electrical and Interferometry Measurement Capability with High Resolution X-ray Diffraction Synchronisation

By |2021-02-18T21:14:42+00:00March 22nd, 2018|

With the US electronics giant IBM having recently filed the first patents for piezoelectric transistors, European physicists, materials scientists and metrologists have joined forces in a project called Nanostrain...

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