Electrical nanoscale metrology in industry
Improved power and material measurements will enable development of optimised, future-proof electronic devices...
High throughput metrology for nanowire energy harvesting devices
Improved power and material measurements will enable development of optimised, future-proof electronic devices...
Dynamic In-situ Electrical and Interferometry Measurement Capability with High Resolution X-ray Diffraction Synchronisation
With the US electronics giant IBM having recently filed the first patents for piezoelectric transistors, European physicists, materials scientists and metrologists have joined forces in a project called Nanostrain...
Electrosciences major partner in a new European Research Project – ADVENT
Improved power and material measurements will enable development of optimised, future-proof electronic devices...
Electrosciences Ltd technically leads H2020 project in nanoelectronics
Electrosciences announces the start of a multinational project funded by the European Commission under the H2020 ICT Programme: PETMEM (Piezoelectronic Transduction Memory Device)...
Nanostrain – European Metrology Research Project
Nanostrain is a global research collaboration between science and industry to provide highly accurate measurement of strain in nano-scale systems to drive innovation...
