Energy harvesting – nanoscale to macroscale characterisation
Improved power and material measurements will enable development of optimised, future-proof electronic devices...
UK Ferroelectrics meeting – Bath 1-2 May 2025
Improved power and material measurements will enable development of optimised, future-proof electronic devices...
Accurately determining the piezoelectric coefficient of nanowires
Improved power and material measurements will enable development of optimised, future-proof electronic devices...
Electrosciences retains ISO9001:2015 accreditation
ISO 9001 Quality Management Systems CERTIFIED FS 736994 Electrosciences retains our ISO9001-2015 quality business certification and accreditation through BSI, for the fourth year running! We are very pleased with the exemplary outcome of our latest audit and remain committed to improving all our services, products and ways in which we support all our [...]
Therminator
Improved power and material measurements will enable development of optimised, future-proof electronic devices...
Electrosciences and aixACCT demonstrates our new tools
Improved power and material measurements will enable development of optimised, future-proof electronic devices...
Energy Harvesting Nanowires- new method to create very long piezoelectric nanowires
Improved power and material measurements will enable development of optimised, future-proof electronic devices...
Energy-Harvesting-Nanowires-EMPIR
Improved power and material measurements will enable development of optimised, future-proof electronic devices...
Operando metrology for energy storage materials – 21GRD01 EMPIR Project
Improved power and material measurements will enable development of optimised, future-proof electronic devices...
Giant electrostriction in single crystals
Giant strains in single crystals of an age old material - a new investigation highlights the importance of atomic defects on performance and durability. A new paper, co-authored by Electrosciences, is published in Applied Physics Letters, Materials. Video of the temperature dependence of XRD scans showing the evolution of the [...]
