Measurement challenges and alignment issues have been addressed by identifying the best measurement practices and incorporating them into the control software for a more user-friendly facility. After this initial success, the next step will be the development of a complex sample environment to allow for temperature, electric and magnetic field applications to be investigated, and last but not least, the system will be upgraded and pushed into the MHz frequency domain. This will be a crucial step in enabling the understanding of materials and devices near real operational conditions: AC control fields and >MHz frequencies.
References Nanostrain home page J. Wooldridge, S. Ryding, S. Brown, T. L. Burnett, M. G. Cain, R. Cernik, R. Hino, M. Stewart, and P. Thompson, “Simultaneous measurement of X-ray diffraction and ferroelectric polarization data as a function of applied electric field and frequency,” J Synchrotron Rad, vol. 19, no. 5, pp. 710–716, Jul. 2012. C. Vecchini, P. Thompson, M. Stewart, A. Muniz-Piniella, S. R. C. McMitchell, J. Wooldridge, S. Lepadatu, L. Bouchenoire, S. Brown, D. Wermeille, O. Bikondoa, C. A. Lucas, T. P. A. Hase, M. Lesourd, D. Dontsov, and M. G. Cain, “Simultaneous dynamic electrical and structural measurements of functional materials,” Rev. Sci. Instrum., vol. 86, no. 10, pp. 103901–10, Oct. 2015.